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10/22/09 - USPTO Class 451 |  15 views | #20090264056 | Prev - Next | About this Page  451 rss/xml feed  monitor keywords

Substrate holder with liquid supporting surface

USPTO Application #: 20090264056
Title: Substrate holder with liquid supporting surface
Abstract: Embodiments of the present invention generally relate to a substrate transferring system. One embodiment of the present invention provides a substrate holder comprising a pedestal plate, a basin wall extending from a top surface of the pedestal plate, wherein the basin wall has a substantially leveled top surface, the basin wall and the pedestal plate define a basin configured to retain a liquid therein, and a liquid port opening to the basin, wherein the liquid port is configured to flow a liquid to the basin and allow the liquid to overflow from the basin wall, and a top surface of the overflow liquid in the basin is configured to support a substrate without contacting the basin wall or the pedestal plate. (end of abstract)



Agent: Patterson & Sheridan, LLP - - Appm/tx - Houston, TX, US
Inventors: Hung Chih Chen, Yin Yuan, Stephen Jew
USPTO Applicaton #: 20090264056 - Class: 451364 (USPTO)

Substrate holder with liquid supporting surface description/claims


The Patent Description & Claims data below is from USPTO Patent Application 20090264056, Substrate holder with liquid supporting surface.

Brief Patent Description - Full Patent Description - Patent Application Claims
  monitor keywords BACKGROUND OF THE INVENTION

1. Field of the Invention

Embodiments of the present invention generally relate to an apparatus and a method for transferring a substrate during processing. More particularly, embodiments of the present invention provide apparatus and method for supporting a substrate during loading and unloading.

2. Description of the Related Art

Sub-micron multi-level metallization is one of the key technologies for the next generation of ultra large-scale integration (ULSI). The multilevel interconnects that lie at the heart of this technology require planarization of interconnect features formed in high aspect ratio apertures, including contacts, vias, trenches and other features.

Planarization is generally performed using Chemical Mechanical Polishing (CMP) and/or Electro-Chemical Mechanical Deposition (ECMP). A planarization method typically requires that a substrate be mounted in a carrier head, with the surface to be polished exposed. The substrate supported by the carrier head is then placed against a rotating polishing pad. The carrier head holding the substrate may also rotate, to provide additional motion between the substrate and the polishing pad surface. A polishing solution is usually supplied to the rotating polishing surface to assist the planarization process.

During the planarization process, the substrate is generally secured on the carrier head from the backside of the substrate, for example by forming vacuum cups between a membrane on the carrier head and the backside of the substrate. Prior to or after the planarization process, a load cup is generally used for substrate transferring to and from a carrier head.

In the state of the art load cup may have a substrate supporting means, for example, support fingers, configured to hold a substrate and transfer the substrate to and from the carrier head. When unloading a substrate from a carrier head, the membrane is usually inflated to release the vacuum cups between the membrane and the backside of the substrate. The substrate will then fall off the carrier head to a load cup underneath under the effect of gravity. FIG. 1 schematically illustrates a substrate holder used in the state of the art load cup. A carrier head 10 having a membrane 11 configured to secure a substrate 12 thereon. The membrane 11 is inflated so that the substrate 12 is no longer drawn to the carrier head 10 by suction. A substrate holder 15 having a plurality of support fingers 14 is positioned underneath the carrier head 10 to catch the substrate 12 once the substrate 12 falls off the carrier head 10 under the effect of gravity. During this transferring process, a processed surface 13 of the substrate 12 is exposed to air or other process environment. The processed surface 13 is generally wet from polishing solutions on polishing stations. Structures, such as copper structures, easily corroded when exposing to air in a wet condition.

The state of the art load cup has several limitations. First, the time requires to load/unload a substrate from a carrier head is relatively long and unpredictable since the load cup passively waits for gravity to take effect. Second, a substrate to be loaded/unloaded is generally wet and exposed to atmosphere during unloading resulting in corrosion on the processed surface.

Therefore, there is a need for apparatus and method to transfer a substrate at an increased and predictable rate and with decreased corrosion.

SUMMARY OF THE INVENTION

The present invention generally relates to a substrate transferring system. Particularly, the present invention relates to a load cup for transferring a substrate with reduced corrosion and increased speed.

One embodiment of the present invention provides a substrate holder comprising a pedestal plate, a basin wall extending from a top surface of the pedestal plate, wherein the basin wall has a substantially leveled top surface, the basin wall and the pedestal plate define a basin configured to retain a liquid therein, and a liquid port opening to the basin, wherein the liquid port is configured to flow a liquid to the basin and allow the liquid to overflow from the basin wall, and a top surface of the overflow liquid in the basin is configured to support a substrate without contacting the basin wall or the pedestal plate.

Another embodiment of the present invention provides a method for transferring a substrate comprising holding the substrate using a first substrate holder, filling a basin in a second substrate holder with a liquid to form a liquid surface over a basin wall of the second substrate holder, maintaining a flow of the liquid to the basin to allow the liquid overflow from the basin wall without disturbing the liquid surface, and releasing the substrate from the first substrate holder to the liquid surface, wherein the substrate is supported on the liquid surface.

Yet another embodiment of the present invention relates to a method for transferring a substrate comprising maintaining a flow of the liquid to a basin of a load cup to form a liquid support surface for supporting a substrate and to allow the liquid overflow from walls of the basin without disturbing the liquid support surface, aligning a first substrate handler with the load cup, wherein the substrate is secured by the first substrate handler, releasing the substrate to the load cup, wherein the substrate is supported by the liquid support surface, aligning a second substrate handler with the load cup, loading the substrate to the second substrate handler, and draining the liquid from the basin of the load cup.

BRIEF DESCRIPTION OF THE DRAWINGS

So that the manner in which the above recited features of the present invention can be understood in detail, a more particular description of the invention, briefly summarized above, may be had by reference to embodiments, some of which are illustrated in the appended drawings. It is to be noted, however, that the appended drawings illustrate only typical embodiments of this invention and are therefore not to be considered limiting of its scope, for the invention may admit to other equally effective embodiments.

FIG. 1 (prior art) schematically illustrates a substrate holder used in the state of the art load cup.

FIG. 2 schematically illustrates a planarization system in accordance with one embodiment of the present invention.

FIG. 3 schematically illustrates a substrate holder in accordance with one embodiment of the present invention.



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