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02/19/09 - USPTO Class 348 |  63 views | #20090046187 | Prev - Next | About this Page  348 rss/xml feed  monitor keywords

Solid-state imaging device

USPTO Application #: 20090046187
Title: Solid-state imaging device
Abstract: A solid-state imaging device includes a pixel array area having pixels including photoelectric transducers arranged as an array; signal lines wired for every pixel column in the pixel array area; and a plurality of noise reducers provided for the corresponding signal lines. Each of the noise reducers includes a first capacitor, one end of which is connected to the signal line; a first switch element, an input port of which is connected to the other end of the first capacitor; a second capacitor connected between an output port of the first switch element and a reference voltage; and a clamping element for clamping the voltage of a connecting node between the output port of the first switch element and the second capacitor to a predetermined voltage. The first capacitor is shared among the plurality of noise reducers. (end of abstract)



Agent: Robert J. Depke Lewis T. Steadman - Chicago, IL, US
Inventors: Atsushi Ooshima, Keiji Mabuchi
USPTO Applicaton #: 20090046187 - Class: 348302 (USPTO)

Solid-state imaging device description/claims


The Patent Description & Claims data below is from USPTO Patent Application 20090046187, Solid-state imaging device.

Brief Patent Description - Full Patent Description - Patent Application Claims
  monitor keywords BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to a solid-state imaging device.

2. Description of the Related Art

Solid-state imaging devices, for example, X-Y addressing solid-state imaging devices typified by complementary metal-oxide semiconductor (CMOS) image sensors, each adopt a structure having noise reduction means, for example, a correlated double sampling (CDS) circuit provided for every pixel column in a pixel array area in order to reduce a fixed pattern noise due to variations in the threshold voltage of transistors in each pixel. The CDS circuit sequentially receives a reset level and a signal level output from each pixel in a selected pixel column in the pixel array area and reduces the fixed pattern noise for every pixel by determining the difference between the reset level and the signal level.

FIG. 7 is a circuit diagram showing a configuration example of a CDS circuit. Referring to FIG. 7, the CDS circuit has a structure having two capacitors 101 and 102, a sampling transistor 103, and a clamp transistor 104. One CDS circuit is provided for every vertical signal line 105 through which a signal of each pixel is transmitted. The vertical signal line 105 is wired for every vertical pixel column of a pixel array area 100 in which pixels are two-dimensionally arranged. In this example, N-channel metal oxide semiconductor (MOS) transistors are used as the sampling transistor 103 and the clamp transistor 104.

One end of the capacitor 101 is connected to the vertical signal line 105. The drain of the sampling transistor 103 is connected to the other end of the capacitor 101. A sampling pulse φSP is applied to the gate of the sampling transistor 103 through a control line 106. One end of the capacitor 102 is connected to the source of the sampling transistor 103 and the other end thereof is grounded. The source of the clamp transistor 104 is connected to the source of the sampling transistor 103. A predetermined clamp voltage Vclp is applied to the drain of the clamp transistor 104 and a clamp pulse φCLP is applied to the gate thereof through a control line 107. A connecting node among the source of the sampling transistor 103, one end of the capacitor 102, and the source of the clamp transistor 104 is hereinafter referred to as a node N.

The CDS circuit having the configuration described above has one horizontal selection transistor 108. The drain of the horizontal selection transistor 108 is connected to the node N and the source thereof is connected to a horizontal signal line 109. Horizontal selection pulses φH, which are sequentially output from a horizontal scanning circuit 110 in synchronization with horizontal scanning, are applied to the gate of the horizontal selection transistor 108. Applying a horizontal scanning pulse φH to the gate of the horizontal selection transistor 108 turns on the horizontal selection transistor 108 so as to output the voltage at the node N to the horizontal signal line 109.

The circuit operation of the CDS circuit having the configuration described above will now be described. First, with a pixel being reset, the sampling transistor 103 and the clamp transistor 104 are turned on and the horizontal selection transistor 108 is turned off to charge the capacitors 101 and 102 based on a reset voltage Vrst of the pixel output through the vertical signal line 105. Electric charges Q1 and Q2 that are calculated according to the following equations are stored in the capacitors 101 and 102:

Q1=C1(Vrst−Vclp)

Q2=C2×Vclp   [Formula 1]

where C1 and C1 represent the capacitances of the capacitors 101 and 102, respectively.

After the clamp transistor 104 is turned off, a signal charge is read out from a photoelectric transducer in the pixel. A signal voltage Vsig of the pixel is output through the vertical signal line 105 to vary a voltage Vout at the node N according to the following equation:

Vout=Vclp+C1(Vsig−Vrst)/(C1+C2)   [Formula 2]



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Patent Applications in related categories:

20090284632 - Driving method of solid-state imaging apparatus and solid-state imaging apparatus - A solid-state imaging apparatus comprises a pixel portion including a plurality of pixels, wherein each pixel including a photoelectric conversion portion, an accumulation portion for accumulating the charge, a first transfer portion connecting the photoelectric conversion portion to the accumulation portion, a second transfer portion connecting the accumulation portion to ...


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